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Olympus announces new industrial laser microscope for 3D surface measurement


Olympus announced today the worldwide launch on June 3 of the LEXT OLS4100 3D measuring laser microscope, an industrial laser microscope for performing 3D observations and measurements of surface features on microelectronic devices and high-functional materials in R&D and quality control applications. The Olympus LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples.

As with current Olympus models, the LEXT OLS4100 guarantees both repeatability and accuracy, while also being capable of high-resolution observation and highly accurate measurement over a wider area. Olympus LEXT OLS4100 3D measuring laser microscope also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

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