Nikon has introduced two groundbreaking industrial lenses, the Rayfact RF3-6x Variable Magnification Lens and the Rayfact RF3-6x Prism-Type Variable Magnification Lens, setting a new benchmark in high-precision inspection technology. These additions to the Rayfact RF series are engineered to excel with high-resolution line scan cameras and large area scan cameras, making them indispensable tools for inspecting intricate patterns on semiconductor wafers and flat panel display (FPD) substrates.
Designed for next-generation semiconductor packages and micro-LED panels, the lenses ensure enhanced resolution and sharpness. This makes them ideal for detecting even the most minute defects on microscopic patterns. The prism-type variant features an optimized optical system tailored for incident illumination, addressing diverse inspection needs across various environments.
With optics built to leverage the full potential of high-resolution large line sensor cameras featuring an 82mm image circle, these lenses deliver exceptional image quality. Equipped with gears on the aperture and floating rings, the lenses enable precise external control of both the aperture and floating mechanisms, adding versatility for industrial applications.
Nikon will begin accepting orders for these lenses on February 1, 2025. For a firsthand look, the lenses will be exhibited at the 39th Nepcon Japan, held at Tokyo Big Sight from January 22 to 24, 2025. These cutting-edge lenses underscore Nikon’s commitment to advancing optical technology, catering to the stringent demands of semiconductor and FPD inspection.