Panasonic today announced that its HIT photovoltaic module’s high-level of resistance to potential induced degradation (PID) has been verified by the results of tests conducted within and outside the company. The test conditions set by the third party organization were very stringent among those applied for various PID tests reported by several organizations. The successful passing of such a severe endurance test has confirmed the high quality and high reliability of Panasonic HIT modules.
PID is a phenomenon in which power output of photovoltaic modules is reduced when they are subjected to external factors such as high temperature and humidity, under the condition that a high voltage is applied across the internal circuits (photovoltaic cells) and the grounded frame. PID can occur in high-temperature and high-humidity environments, where the system voltage is high.
