Tag: Probe-Pin

  • Omron develops ultra-compact probe pin for Inspection of High-density ICs

    Omron develops ultra-compact probe pin for Inspection of High-density ICs

    Omron today announced that it has developed an ultra-compact probe pin electroformed through an electroplating process, and commenced its mass production. A probe pin is a contact pin used for inspection of electronic components. The employment of electroforming technology has led to superior characteristics, which are difficult to achieve with the currently available cutting process.…